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Hommel Etamic


A Jenoptik product line. Measurement and testing systems across a wide range of standard products, which also serve as the basis for developing systems tailored to specific plant needs, with non-contact technologies for measuring the roughness of shapes and profiles in the workshop, laboratory, and on the production line. Hommel Etamic enables you to effectively monitor and guarantee the quality of your workpieces throughout the entire production process.


W5

Optional P5 printer with Bluetooth® connection

It includes a high-performance rechargeable battery that allows up to 800 measurements on a single charge. The roughness probes are easily changed, and measurements can be taken in any position, even upwards.

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W5

Maximum journey length:

17.5 mm

Measurement Speed:

​0.15 | 0.5 | 1 mm/s

Measurement Range:

T1E probe: ±100 μm/6 nm 

Software:

Evovis Mobile Measurement and Evaluation, with the capacity to store up to 5 measurement programs.


W10

Thermal printer integrated


To immediately document tolerance assessments, profiles, Abbott curves, and statistics. The Evovis Mobile software features seven different programs operated via a touchscreen. Transverse palpation for vertical measurements.

Quote

W10

Maximum journey length:

17.5 mm

Measurement Speed:

​0.15 | 0.5 | 1 mm/s

Measurement Range:

T1E probe: ±100 μm/6 nm 

Software:

Evovis Mobile Measurement and Evaluation

W15W15 con stand de medición de altura opcional.

Roughness Measurement in Any position

The tripod's extendable legs and a 3-point support on the feed device allow for easy adjustment of the desired measuring position.

Quote


Maximum journey length:

17.5 mm

Measurement Speed:

​0.15 | 0.5 | 1 mm/s

Measurement Range:

T1E probe: ±100 μm/6 nm 

Software:

Evovis Mobile Measurement and Evaluation

W15

W40EL set W40 tiene stand de medición de altura opcional.

Measure roughness, waviness and profiles with Waveline Xmove 20

Motorized probe descent for automatic positioning, in any orientation and position, including upwards with the appropriate probes.

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W40

Maximum journey length:

20 mm

Probe descent

4 mm

Velocidad de Medición:

​0.15 | 0.5 | 1 mm/s

Rango de Medición:

T1E probe: ±100 μm/6 nm 

Software:

Evovis Mobile Measurement and Evaluation

F900The W920 has optional additional axles.

Nanoscan probe for measuring roughness and contour

Designed for High Performance Metrology, such as the environment of automated process chains.

Quote


Maximum journey length:

500 mm en columna

200 mm transversal

W920

550 mm column and vibration-damping instrument table.

Shape, roughness and twist Measurements with automatic part alignment

All in one workpiece clamping system. With CNC-controlled axes and equipped with a high-precision pneumatic rotary table. Suitable for serial production environments and metrology tasks that change frequently, as it can be optionally equipped with a double-ended probe arm.

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F900

Vertical measuring axis height in models 350, 550 and 900:

350, 550 o 900 mm

Distance between C/Z axes, maximum radius of the interfering edge:

370 mm (420 mm bajo pedido)

Maximum test diameter:

​430 mm (530 mm bajo pedido)

Maximum height measurement

350, 550 o 900 mm

Software:

Turbo Form

Rotation Axis (C)

Roundness deviation (radial) μm+μm/mm measurement


0.02 μm + H*0.0005 μm

Rotation Axis (C)

Axial deviation (μm+μm/mm of radius)


0.03 μm + R*0.0005 μm

Vertical Axis (Z)

Straightness deviation/100 mm


0.15 μm, 0.15 μm o 0.25 μm

Horizontal Axis (R)

Straightness deviation/100 mm


0.25 μm

Optional X and Y axes for precise part positioning.

Optical Inspection of Holes without operator intervention

For offline installation, Visionline V200 devices inspect holes in surfaces directly in the workshop, have a B5 or B20 sensor and detect gaps, pores, scratches or cracks.

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Maximum journey length:

500 mm en columna

200 mm transversal

V200